A Process-Based Temperature Compensated On-Chip CMOS VHF VCRO in 130-nm Si-Ge BiCMOS by Implementing an Empirical Control Equation
dc.citation.volume | 10 | |
dc.contributor.author | Hasan SMR | |
dc.contributor.editor | Sin S-W | |
dc.date.accessioned | 2023-10-18T21:26:27Z | |
dc.date.accessioned | 2023-10-19T20:38:40Z | |
dc.date.available | 2022-12-08 | |
dc.date.available | 2023-10-18T21:26:27Z | |
dc.date.available | 2023-10-19T20:38:40Z | |
dc.date.issued | 2022-12-14 | |
dc.date.updated | 2023-10-18T21:17:00Z | |
dc.description.abstract | This paper presents a low-power CMOS temperature and process compensated 150.9 MHz Very-high-frequency (VHF) voltage-controlled-ring-oscillator (VCRO) for on-chip integration. The design employs a CMOS temperature-sensor and novel feedback control circuitry to generate the internal control-voltage for the VCRO which ensures oscillation in the vicinity of the desired frequency despite variations in temperature. The control circuitry is the implementation of an empirical equation expressing a temperature sensor-voltage into a specific control-voltage for three different process corners using three different switches. The control-voltage calibrates against temperature variation for the specific process-corner in order to maintain the same frequency of oscillation. Simulations shows that the proposed design maintains the oscillator's frequency within 0.39% from -10°C to 90°C. The fabricated chip implemented in 130-nm GF 8HP Si-Ge BiCMOS process, occupies an area of 0.0242-mm2 and consumes 325 μW while operating with a 1 V supply-voltage. The performance was verified through experimental immersion of DUT (device-under-test) in a temperature-controlled water-bath in the range 22.5°C-70°C. | |
dc.description.confidential | false | |
dc.format.extent | 128664-128669 | |
dc.identifier.citation | Rezaul Hasan SM. (2022). A Process-Based Temperature Compensated On-Chip CMOS VHF VCRO in 130-nm Si-Ge BiCMOS by Implementing an Empirical Control Equation. IEEE Access. 10. (pp. 128664-128669). | |
dc.identifier.doi | 10.1109/ACCESS.2022.3227566 | |
dc.identifier.eissn | 2169-3536 | |
dc.identifier.elements-type | journal-article | |
dc.identifier.harvested | Massey_Dark | |
dc.identifier.uri | http://hdl.handle.net/10179/20345 | |
dc.language | English | |
dc.publisher | IEEE | |
dc.publisher.uri | https://ieeexplore.ieee.org/document/9975319 | |
dc.relation.isPartOf | IEEE Access | |
dc.rights | CC BY 4.0 | en_US |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | en_US |
dc.subject | Analog CMOS circuits | |
dc.subject | temperature compensation | |
dc.subject | process compensation | |
dc.subject | voltage-controlled-ring-oscillator | |
dc.subject | circuit design | |
dc.subject | VHF | |
dc.subject | radio-frequency | |
dc.subject | water-bath | |
dc.title | A Process-Based Temperature Compensated On-Chip CMOS VHF VCRO in 130-nm Si-Ge BiCMOS by Implementing an Empirical Control Equation | |
dc.type | Journal article | |
pubs.elements-id | 458851 | |
pubs.organisational-group | Other |
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