Analysis and application of digital spectral warping in analog and mixed-signal testing
dc.citation.volume | 52 | |
dc.contributor.author | Allen WP | |
dc.contributor.author | Bailey D | |
dc.contributor.author | Demidenko SN | |
dc.contributor.author | Piuri V | |
dc.date.accessioned | 2007-11-13T01:45:49Z | |
dc.date.accessioned | 2007-11-25T23:05:08Z | |
dc.date.accessioned | 2016-03-06T22:24:51Z | |
dc.date.available | 2007-11-13T01:45:49Z | |
dc.date.available | 2007-11-25T23:05:08Z | |
dc.date.available | 2016-03-06T22:24:51Z | |
dc.date.issued | 2003 | |
dc.description.abstract | Spectral warping is a digital signal processing transform which shifts the frequencies contained within a signal along the frequency axis. The Fourier transform coefficients of a warped signal correspond to frequency-domain 'samples' of the original signal which are unevenly spaced along the frequency axis. This property allows the technique to be efficiently used for DSP-based analog and mixed-signal testing. The analysis and application of spectral warping for test signal generation, response analysis, filter design, frequency response evaluation, etc. are discussed in this paper along with examples of the software and hardware implementation. | |
dc.identifier.citation | Allen, W. R. M.; Bailey, D. G.; Demidenko, S. N.; Piuri, V. (2003). Analysis and application of digital spectral warping in analog and mixed-signal testing. IEEE Transactions on Reliability. Vol. 52, No. 4, pp. 444-457. | |
dc.identifier.doi | 10.1109/TR.2003.821933 | |
dc.identifier.harvested | Massey_Dark | |
dc.identifier.harvested | Massey_Dark | |
dc.identifier.issn | 0018-9529 | |
dc.identifier.uri | https://hdl.handle.net/10179/279 | |
dc.language.iso | en | |
dc.publisher | Institute of Electrical and Electronics Engineers | |
dc.relation.isbasedon | IEEE Transactions on Reliability. Vol. 52, No. 4, pp. 444-457. | |
dc.relation.isformatof | http://ieeexplore.ieee.org/iel5/24/28169/01260595.pdf | |
dc.title | Analysis and application of digital spectral warping in analog and mixed-signal testing | |
dc.type | Journal article |
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