Towards an Explainable Machine Learning Framework for Sketched Diagram Recognition

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dc.citation.volume3359
dc.contributor.authorSingh A
dc.contributor.authorImtiaz MA
dc.contributor.authorBlagojevic R
dc.contributor.editorSmith-Renner A
dc.contributor.editorTaele P
dc.coverage.spatialSydney, Australia
dc.date.accessioned2025-05-21T20:34:05Z
dc.date.available2025-05-21T20:34:05Z
dc.date.finish-date2023-03-31
dc.date.issued2023-01-01
dc.date.start-date2023-03-27
dc.description.abstractIn recent years, machine learning has made significant advancements in various fields, including image recognition. However, the complexity of these models often makes it difficult for users to understand the reasoning behind their predictions. This is especially true for sketch recognition, where the ability to understand and explain the model's decision-making process is crucial. To address this issue, our research focuses on developing an explainable machine learning framework for sketch recognition. The framework incorporates techniques such as feature visualization and feature attribution methods which provide insights into the model's decision-making process. The goal of this research is to not only improve the performance of sketch recognition models but also to increase their interpretability, making them more usable and trustworthy for users.
dc.description.confidentialfalse
dc.format.pagination190-197
dc.identifier.citationSingh A, Imtiaz MA, Blagojevic R. (2023). Towards an Explainable Machine Learning Framework for Sketched Diagram Recognition. Smith-Renner A, Taele P. CEUR Workshop Proceedings. (pp. 190-197). CEUR-WS Team.
dc.identifier.elements-typec-conference-paper-in-proceedings
dc.identifier.issn1613-0073
dc.identifier.urihttps://mro.massey.ac.nz/handle/10179/72930
dc.publisherCEUR-WS Team
dc.publisher.urihttp://ceur-ws.org/Vol-3359/paper24.pdf
dc.rights(c) 2023 The Author/s
dc.rightsCC BY 4.0
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.source.journalCEUR Workshop Proceedings
dc.source.name-of-conference28th International ACM Conference on Intelligent User Interfaces (ACM IUI 2023)
dc.subjectExplainable AI
dc.subjectSHAP
dc.subjectSketch recognition
dc.subjectDigital ink recognition
dc.subjectDiagram recognition
dc.titleTowards an Explainable Machine Learning Framework for Sketched Diagram Recognition
dc.typeconference
pubs.elements-id460812
pubs.organisational-groupOther
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